发明名称 High durability mask for dry etch processing of GaAs
摘要 A mask is described which enables the fabrication of features in GaAs such as waveguides, channels, facets, mesas, and mirrors by dry etch processing in chlorine containing ambients. The mask consists of an amorphous form of carbon which may contain incorporated hydrogen. The mask can be applied, patterned and removed through dry processing techniques.
申请公布号 US5378316(A) 申请公布日期 1995.01.03
申请号 US19930001432 申请日期 1993.01.07
申请人 EASTMAN KODAK COMPANY 发明人 FRANKE, HANS-GEORGE;PRINCE, ERIC T.
分类号 H01L21/302;H01L21/3065;H01L21/308;(IPC1-7):H01L21/00 主分类号 H01L21/302
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