发明名称 PHOTOSENSITIVE RESIN COMPOSITION AND PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To obtain a photosensitive resin composition having high sensitivity not only to a g-line (wavelength; 436 nm) or an i-line (wavelength; 365 nm) of a conventional high-pressure mercury vapor lamp but to a light source of a short wavelength such as a KrF excimer laser (248 nm) or an ArF excimer laser (193 nm) and also having high plasma resistance when used as a resist. <P>SOLUTION: By incorporating nano-diamond into a photosensitive resin composition, high sensitivity not only to a g-line (wavelength; 436 nm) or an i-line (wavelength; 365 nm) but to a light source of a short wavelength such as a KrF excimer laser (248 nm) or an ArF excimer laser (193 nm) and improved plasma resistance are provided to the composition. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005234019(A) 申请公布日期 2005.09.02
申请号 JP20040039906 申请日期 2004.02.17
申请人 KRI INC 发明人 SATO MASAHIRO;UEDA MASAHIRO;KITAJIMA SATSUKI
分类号 G03F7/004;G03F7/039;H01L21/027 主分类号 G03F7/004
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