发明名称 |
PHOTOSENSITIVE RESIN COMPOSITION AND PATTERN FORMING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To obtain a photosensitive resin composition having high sensitivity not only to a g-line (wavelength; 436 nm) or an i-line (wavelength; 365 nm) of a conventional high-pressure mercury vapor lamp but to a light source of a short wavelength such as a KrF excimer laser (248 nm) or an ArF excimer laser (193 nm) and also having high plasma resistance when used as a resist. <P>SOLUTION: By incorporating nano-diamond into a photosensitive resin composition, high sensitivity not only to a g-line (wavelength; 436 nm) or an i-line (wavelength; 365 nm) but to a light source of a short wavelength such as a KrF excimer laser (248 nm) or an ArF excimer laser (193 nm) and improved plasma resistance are provided to the composition. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005234019(A) |
申请公布日期 |
2005.09.02 |
申请号 |
JP20040039906 |
申请日期 |
2004.02.17 |
申请人 |
KRI INC |
发明人 |
SATO MASAHIRO;UEDA MASAHIRO;KITAJIMA SATSUKI |
分类号 |
G03F7/004;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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