发明名称 Semiconductor strain sensor with Wheatstone bridge drive voltage compensation circuit.
摘要 <p>A drive circuit for a strain sensor includes a Wheatstone bridge (5) having semiconductor strain gauges (1-4). A temperature-dependent voltage generator (10) generates a voltage having a predetermined ambient temperature dependency characteristic, a constant voltage generator (11) generates a predetermined constant voltage, and a proportional voltage generator (12) generates a voltage proportional to an externally supplied power source voltage (VCC). A voltage processor (13) receives and arithmetically processes output voltages of the temperature-dependent voltage generator (10), the constant voltage generator (11) and the proportional voltage generator (12) to generate a bridge drive voltage (V13) which changes from a mid value to a predetermined voltage depending on a temperature proportional to the power source voltage. In an amplifier circuit for amplifying a strain output signal from the Wheatstone bridge, both the potentials across an AC coupling capacitor are kept to be equal at a steady-state operation. Detection sensitivity variations due to the temperature dependency characteristic of the strain gauges can be effectively compensated.</p>
申请公布号 EP0631121(A2) 申请公布日期 1994.12.28
申请号 EP19940304595 申请日期 1994.06.24
申请人 NEC CORPORATION 发明人 MIYANO, SOICHIRO, C/O NEC CORPORATION
分类号 G01B7/16;G01D3/028;G01L1/22;G01L9/06;H03F3/68;(IPC1-7):G01L1/22 主分类号 G01B7/16
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