| 摘要 |
PCT No. PCT/GB92/02239 Sec. 371 Date Jul. 19, 1993 Sec. 102(e) Date Jul. 19, 1993 PCT Filed Dec. 2, 1992 PCT Pub. No. WO93/11469 PCT Pub. Date Jun. 10, 1993.An optical analysis or processing system for use, for example, in the analysis of microscopic spots of material by their effect on a very fine polarized beam of light (e.g., FPIA). For multiple "spot" analysis the spot samples are disposed on a substrate in predetermined relation with an optical pattern, bars, chevrons, etc. The substrate is mounted in the path of the fixed and focused beam with three degrees of freedom of movement. A video camera records the optical pattern very accurately and controls the substrate mounting to position a selected sample spot at the beam focus. Multiple and rapid sample analysis can thus be performed.
|
