| 摘要 |
A memory part (10), with memory (14) subarrays arranged in different ways, provides one data input and output path for normal operation and another data input and output path for test mode operation. The part furnishes one data output multiplexer (40) connected between the memory (14) subarrays and the data output buffers (24) for normal operation. The part furnishes another data output multiplexer (52) connected between the memory (14) subarrays and the data output buffers for test mode operation. Test mode circuits (30) on the memory part select operation of the one and the other multiplexer. Data input gating circuits connect between the data in buffers (22) and the memory (14) subarrays and connect all or one of the data input leads D0-8 to the memory subarrays in response to operation of the test mode circuits.
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