发明名称 RADIATION SENSITIVE RESIST HAVING TWO-LAYERED STRUCTURE, ITS PRODUCTION AND RESIST PATTERN FORMING METHOD USING THE SAME
摘要 PURPOSE:To inhibit deformation from a desired resist pattern by a variation of the film thickness of a radiation sensitive resist due to the reflection of radiation from the substrate and to extend the tolerance level of process conditions in a producing process as well as to give a high yield. CONSTITUTION:This radiation sensitive resist having a two-layered structure has a thin film based on a conjugated polymer having electron withdrawing functional groups other than cyano between the substrate and a radiation sensitive resist.
申请公布号 JPH06348035(A) 申请公布日期 1994.12.22
申请号 JP19930138456 申请日期 1993.06.10
申请人 TORAY IND INC 发明人 CHIKUGI TOSHIHIRO;ICHIJO TSUTOMU
分类号 G03F7/11;G03F7/26;H01L21/027;(IPC1-7):G03F7/26 主分类号 G03F7/11
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