发明名称 |
RADIATION SENSITIVE RESIST HAVING TWO-LAYERED STRUCTURE, ITS PRODUCTION AND RESIST PATTERN FORMING METHOD USING THE SAME |
摘要 |
PURPOSE:To inhibit deformation from a desired resist pattern by a variation of the film thickness of a radiation sensitive resist due to the reflection of radiation from the substrate and to extend the tolerance level of process conditions in a producing process as well as to give a high yield. CONSTITUTION:This radiation sensitive resist having a two-layered structure has a thin film based on a conjugated polymer having electron withdrawing functional groups other than cyano between the substrate and a radiation sensitive resist. |
申请公布号 |
JPH06348035(A) |
申请公布日期 |
1994.12.22 |
申请号 |
JP19930138456 |
申请日期 |
1993.06.10 |
申请人 |
TORAY IND INC |
发明人 |
CHIKUGI TOSHIHIRO;ICHIJO TSUTOMU |
分类号 |
G03F7/11;G03F7/26;H01L21/027;(IPC1-7):G03F7/26 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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