发明名称 PLANT MONITORING AND DIAGNOSING SYSTEM AND NON-DESTRUCTIVE INSPECTING AND DIAGNOSING SYSTEM
摘要 PURPOSE:To provide a non-destructive inspecting and diagnosing system which can exactly monitor and diagnose a plant and easily recognize an occurred defect. CONSTITUTION:Reference characters 1a-1c show sensors, and 2a-2c show signal processors. A state quantity calculator 3 calculates a quantity of state for representing an environment of a plant based on monitor information to be input from the processors 2a-2c. A state predicting unit 4 calculates to predict the quantity of the state after a predetermined time based on the quantity of the state, monitor information to be input from the calculator 3 and timing change of the quantity of the state. A future event predicting unit 5 predicts a future event based on the predicting information of the quantity of the state to be input from the unit 4. An image information processor 6a converts the quantity of the state to be input from the calculator 3 into image information, and displays it on a display unit 7a. An image information processor 6b converts the predicted quantity of the state after the predetermined time to be input from the unit 4 into image information, and displays it on a display unit 7b. An image information processor 6c converts the future event predicted by the unit 5 into image information, and displays it on a display unit 7c.
申请公布号 JPH06347379(A) 申请公布日期 1994.12.22
申请号 JP19930134572 申请日期 1993.06.04
申请人 HITACHI LTD 发明人 TAKAHASHI FUMINOBU;KOIKE MASAHIRO;UCHIDA SHUNSUKE;FUJIMORI HARUO;YAMADA IZUMI;FUKUZAKI KOJI;NAGASE MAKOTO
分类号 G01M99/00;G05B23/02;G21C17/00;(IPC1-7):G01M19/00 主分类号 G01M99/00
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