发明名称 CUSTOM IC MEASURING APPARATUS IN PROXIMITY FUSES
摘要 A device is disclosed to compare the data measuring value corresponding to each condition with the reference established range in several conditions and to select only custom IC of a good quality. The device characterizes that one chip computer is connected with each latch buffer circuit, a display driving circuit and a general printer apparatus, so as data to be exchanged; one side latch buffer circuit is connected to D/A converter and an output terminal side of another latch buffer circuit is connected with the D/A converter, a multiplexer and bases of a transistor, and other latch buffer circuit is connected with multiplexers, the display driving circuit and the printer apparatus; and respective terminals of the custom IC are connected with the multiplexer, an inverter, a peak detector, a relay switch, an amplifier, a supply power part, etc.
申请公布号 KR940011630(B1) 申请公布日期 1994.12.22
申请号 KR19890011557 申请日期 1989.08.14
申请人 DAEWOO ELECTRONICS CO., LTD. 发明人 YU, WAN - DONG
分类号 F42C21/00;(IPC1-7):F42C21/00 主分类号 F42C21/00
代理机构 代理人
主权项
地址