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发明名称
PARTICLE INSPECTING DEVICE AND INSPECTING METHOD THEREFOR
摘要
申请公布号
JPH06347415(A)
申请公布日期
1994.12.22
申请号
JP19930139734
申请日期
1993.06.11
申请人
NEC CORP
发明人
INAI MAKOTO
分类号
H01L21/66;G01N21/88;G01N21/94;G01N21/956;(IPC1-7):G01N21/88
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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