发明名称 Method for fabricating polycrystalline silicon having micro roughness on the surface.
摘要 <p>A method for fabricating a polycrystalline silicon having a roughed surface, which is useful for a capacitor electrode is disclosed. The method is featured by depositing a polycrystalline silicon layer in such a manner that grains of silicon are caused at the surface of the polycrystalline silicon layer. The polycrystalline silicon layer thus obtained has a large effective surface area and is suitable for a capacitor electrode because of its increased effective surface area. <IMAGE></p>
申请公布号 EP0630055(A2) 申请公布日期 1994.12.21
申请号 EP19940111698 申请日期 1991.03.20
申请人 NEC CORPORATION 发明人 WATANABE, HIROHITO;TATSUMI, TORU
分类号 H01L21/02;H01L27/108;H01L29/92;(IPC1-7):H01L29/94;H01L21/20;H01L29/04 主分类号 H01L21/02
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