发明名称 |
Method and apparatus for producing compound semiconductor single crystal of high decomposition pressure |
摘要 |
PCT No. PCT/JP91/01547 Sec. 371 Date May 19, 1993 Sec. 102(e) Date May 19, 1993 PCT Filed Nov. 12, 1991 PCT Pub. No. WO93/22040 PCT Pub. Date Nov. 11, 1993.An apparatus and a method are presented for preparing a single crystal ingot of a compound semiconductor material which contains a high vapor pressure component. The apparatus includes: a furnace housing 78 housing a cylindrical hermetic vessel 20 having a ceiling plate section 22A and a bottom plate section 42. External heaters 36, 38 and 40 surrounding the hermetic vessel 20, and a vapor pressure control section which communicates hermetically with the vessel 20. The vapor pressure control section includes: a vapor pressure control tube 98 having a hermetic inner space formed between an inner wall 102 and a coaxial outer wall 100; a communication conduit 96 which hermetically communicates the inner space of the vapor pressure control tube 98 with the inner space of the vessel 20; heat pipes 108, 112 extending along at least one of either the inner wall or the outer wall; control heaters 110, 114 disposed both on the inside of the inner wall and on the outside of the outer wall of the vapor pressure control section 98.
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申请公布号 |
US5373808(A) |
申请公布日期 |
1994.12.20 |
申请号 |
US19930050325 |
申请日期 |
1993.05.19 |
申请人 |
MITSUBISHI MATERIALS CORPORATION;RESEARCH DEVELOPMENT CORPORATION OF JAPAN;ZAIDAN HOJIN HANDOTAI KENKYU SHINKOKAI |
发明人 |
SASSA, KOICHI;ATAMI, TAKASHI;SHIRATA, KEIJI |
分类号 |
C30B15/00;C30B15/02;(IPC1-7):C30B15/22 |
主分类号 |
C30B15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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