发明名称 WAFER LEVEL PACKAGE PREVENTING A CHIPPING DEFECT AND MANUFACTURING METHOD THEREOF
摘要 A wafer level package having a molding part of suppressing breakage is provided to form encapsulation resin on a wafer level package by a simplified process by forming encapsulation resin on six surfaces of a semiconductor chip by only one molding process. A connection part(110) of a protrusion type is formed on the surface of a semiconductor chip. A molding part(112) for suppressing breakage surrounds six surfaces of the semiconductor chip, exposing the connection part. A silicon exposure part is partially formed on the lateral surface of the molding part. The connection part can be one of a solder ball or a solder bump. The silicon exposure part can exist in the center region of the lateral surface of the semiconductor chip.
申请公布号 KR20080088990(A) 申请公布日期 2008.10.06
申请号 KR20070031931 申请日期 2007.03.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, IN SIK
分类号 H01L23/12 主分类号 H01L23/12
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