发明名称 |
WAFER LEVEL PACKAGE PREVENTING A CHIPPING DEFECT AND MANUFACTURING METHOD THEREOF |
摘要 |
A wafer level package having a molding part of suppressing breakage is provided to form encapsulation resin on a wafer level package by a simplified process by forming encapsulation resin on six surfaces of a semiconductor chip by only one molding process. A connection part(110) of a protrusion type is formed on the surface of a semiconductor chip. A molding part(112) for suppressing breakage surrounds six surfaces of the semiconductor chip, exposing the connection part. A silicon exposure part is partially formed on the lateral surface of the molding part. The connection part can be one of a solder ball or a solder bump. The silicon exposure part can exist in the center region of the lateral surface of the semiconductor chip. |
申请公布号 |
KR20080088990(A) |
申请公布日期 |
2008.10.06 |
申请号 |
KR20070031931 |
申请日期 |
2007.03.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO, IN SIK |
分类号 |
H01L23/12 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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