发明名称 IR gas analysis method and IR gas analyser for carrying out the method
摘要 The invention relates to a compact infrared gas analyser which, as a result of an improved light source (8), produces less heat and is furthermore easier to operate. A shutter (24, 16) may be located both between the light source (8) and a measurement cell (1) and between the measurement cell (1) and a detector (15), the shutter being generally closed. It is only opened during a measurement. As the light source, use is made of a resistor (element) which has a resistive element comprising RuO2, W, SnO2, FeCrAlY, Pt, Pt-Rh or Pt-Pd, lying on an AlN substrate. In this case, the light source (8) and shutters (16, 24) are controlled by a predetermined control program. <IMAGE>
申请公布号 DE4420340(A1) 申请公布日期 1994.12.15
申请号 DE19944420340 申请日期 1994.06.10
申请人 HORIBA LTD., KYOTO, JP 发明人 TOMITA, KATSUHIKO, KYOTO, JP
分类号 G01J3/10;G01N21/35;H01K1/02;H01K7/00;(IPC1-7):G01N21/61;H01C7/02;H01K1/04 主分类号 G01J3/10
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