| 摘要 |
Method and device for measuring the layer thickness of thin organic films or organic films on a surface, in particular the lubricated (oiled) surface of cold-rolled products such as cold-rolled strip, in which the absorption, proportional to the layer thickness, of infrared light in the waveband region of the CH valence fluctuations typical of oil of lambda = 3.3 to 3.5 mu m is compared by reflection measurement with a reflection measurement of infrared light in the non-absorbed wavelength region of 3.6 to 4.2 mu m, and from this the layer thickness is calculated and displayed.
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| 申请人 |
BETRIEBSFORSCHUNGSINSTITUT VDEH - INSTITUT FUER ANGEWANDTE FORSCHUNG GMBH, 40237 DUESSELDORF, DE |
发明人 |
KRANNICH, STEPHAN, 4000 DUESSELDORF, DE;MENNICKEN, HERIBERT, 4000 DUESSELDORF, DE;BOHLAENDER, PETER, DR., 4000 DUESSELDORF, DE;KECK, ROLAND, DR., 4000 DUESSELDORF, DE;RUDNICK, MANFRED, 4020 METTMANN, DE;KLUTH, KARL-HEINZ, 4100 DUISBURG, DE |
