发明名称 Automative diagnostic testing apparatus
摘要 A diagnostic testing apparatus for testing an electrical component normally controlled by pulse signals from the electronic control module (ECM) of an automotive electrical system, which apparatus is coupled between the ECM and the component to be tested and provides first circuits establishing a normal signalling communication therebetween, and second circuits comprising parallel test circuits including indicators and switches constructed and arranged for indicating faults in the component.
申请公布号 US5369991(A) 申请公布日期 1994.12.06
申请号 US19930139558 申请日期 1993.10.20
申请人 ABE ELECTRONICS, INC. 发明人 ARMSTRONG, RICHARD W.
分类号 F02P17/02;G01R31/00;(IPC1-7):G01M15/00 主分类号 F02P17/02
代理机构 代理人
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