| 摘要 |
PURPOSE:To provide a fluorescent X-ray analytic method for allowing highly accurate quantitative calculation of a sample containing such element as the intensity of Compton scattering ray can not be measured using fluorescent X-rays. CONSTITUTION:A compositional ratio is assumed and the intensity of fluorescent X-ray is calculated along with the intensity of Compton scattering light of primary X-rays. The intensity of fluorescent X-rays is then rendered to correspond, respectively, with the compositional elements for which the fluorescent X-rays can be measured and the compositional elements for which the intensity of Compton scattering ray can not be measured so that the actual measurements of the intensity of fluorescent X-rays and the intensity of Compton scattering light matches the theoretical values thus correcting and sequentially approximating the compositional ratio. |
