| 摘要 |
PURPOSE:To generate an inspection sequence ensuring high fault coverage in the fault propagation processing of one time frame by allocating a logical value of test mode to the mode setting signal line of a scan memory element and starting the fault propagation from an allocated state. CONSTITUTION:Current time is set at T and a decision tree is allocated to a signal line M thus setting a logical value 1. A D frontier is then set for the signal line M and a logical value 0 is set for signal lines C, E in order to propagate a target fault on a signal line Y. The time is set at T-1 and a logic value 1 is set for the signal line M. Subsequently, a target pseudo-external output is set for the input signal line of a DFF 2103, the D frontier is set for the output line from the DFF 2102, and logical O is set for the input signal line to the DFF 2104 and a signal line A. The time is then set at T-2 and a logical 1 is set for the signal line M. The scan input signal to the DFF 2102 is employed as a target pseudo-external input and the D frontier arrives at a target fault thus succeeding in the fault propagation. Subsequently, the state is validated thus succeeding in the generation of inspection sequence. |
