Semiconductor integrated circuit including output buffer.

摘要

A semiconductor integrated circuit having a test mode in addition to a normal mode, includes a mode detecting circuit (14) for detecting a state of each mode and generating a mode signal, a prebuffer circuit (12) for receiving the mode signal generated by the mode detecting circuit, amplifying an input signal by using an output driving capacity corresponding to the mode signal, and outputting the amplified signal, and an output buffer circuit (13) for receiving an output from the prebuffer circuit and outputting data outside the integrated circuit.