发明名称 Method for fabricating polycrystalline silicon having micro roughness on the surface
摘要 A method for fabricating a polycrystalline silicon having a roughed surface, which is useful for a capacitor electrode is disclosed. The method is featured by depositing a polycrystalline silicon layer in such a manner that grains of silicon are caused at the surface of the polycrystalline silicon layer. The polycrystalline silicon layer thus obtained has a large effective surface area and is suitable fur a capacitor electrode because of its increased effective surface area.
申请公布号 US5366917(A) 申请公布日期 1994.11.22
申请号 US19910672073 申请日期 1991.03.19
申请人 NEC CORPORATION 发明人 WATANABE, HIROHITO;TATSUMI, TORU
分类号 H01L21/02;H01L27/108;H01L29/92;(IPC1-7):H01L21/205 主分类号 H01L21/02
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