发明名称 Leak detection in a reduced pressure processing apparatus
摘要 A reduced pressure processing apparatus includes a processing vessel for performing predetermined processing to an object to be processed in a reduced pressure atmosphere, an exhaust mechanism, including a main exhaust system having a relatively high exhaust pressure and a sub-exhaust system having a relatively low exhaust pressure, for evacuating the processing vessel, and an oxygen gas concentration sensor for detecting an oxygen gas concentration in the processing vessel during exhaust performed by the sub-exhaust system. The oxygen gas concentration in the processing vessel is detected while the processing vessel is evacuated with a relatively low exhaust pressure. It is determined whether leakage is present or absent by confirming a detection value is a predetermined value or less within a predetermined period of time. When leakage is absent, the processing vessel is evacuated with the relatively high exhaust pressure. When leakage is present, the exhaust is interrupted, and necessary processing is performed. When the processing vessel is set in a desired reduced pressure state, predetermined processing is performed to the substrate.
申请公布号 US5365772(A) 申请公布日期 1994.11.22
申请号 US19930087859 申请日期 1993.07.09
申请人 TOKYO ELECTRON LIMITED;MITSUBISHI ELECTRIC CORPORATION 发明人 UEDA, YASUHIRO;TAKAHASHI, HIRONARI
分类号 C30B25/14;G01M3/22;G01N1/00;G01N30/72;H01L21/205;H01L21/31;(IPC1-7):G01M3/04 主分类号 C30B25/14
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