| 摘要 |
PURPOSE:To provide a nondestructive examination device using an image processing method which shortens the time required for examining flaws on a member surface and requires no special certification for the examination. CONSTITUTION:The nondestructive examination device consists of a lamp 4 that illuminates a to-be-examined object such as a tenon 2a, a camera 5 that images the object, an image processing device 6 that consists of a memory 8 for storing the imaged data, a binarizing process device 9 in which the first image is prepared from the imaged data in the memory 8, a reversing process device 12 in which the second image is prepared from the first image, an inflation process device 10 in which the third image is prepared from the first image, a reduction process device 11 in which the fourth image is prepared from the third image and an AND process device 13 in which the fifth image is prepared from both the second and fourth image and a decision display device 7 in which flaw dimensions of the fifth image are compared with allowable ones for decision on permission and then the result is displayed or an alarm is issued. |
