发明名称 Thin film capacitive memory device with a high dielectric constant
摘要 A semiconductor device comprising a capacitor which comprises a lower electrode, a dielectric insulating film of a metal oxide, and a upper electrode. The lower electrode is made of at least yttrium (Y) or hafnium (Hf).
申请公布号 US5365096(A) 申请公布日期 1994.11.15
申请号 US19920881633 申请日期 1992.05.12
申请人 SHARP KABUSHIKI KAISHA 发明人 TANIGUCHI, KOUJI
分类号 H01L27/04;H01L21/02;H01L21/28;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;H01L29/43;H01L29/92;(IPC1-7):H01L29/68;H01L29/78;H01L27/22;H01L29/82 主分类号 H01L27/04
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