发明名称 Method of manufacturing X-ray exposure mask
摘要 The present invention relates to a method of manufacturing an exposure mask having an unprecedented supermicrostructure for an X-ray exposure method favorable for conventional supermicro exposure using lithography techniques. The method of manufacturing an X-ray exposure mask comprises the steps of alternately laminating two kinds of compound semiconductors as a thin film having a periodic structure with controllability of about one atomic layer on a substrate selectively etching only one material for forming the periodic structure, forming an uneven difference between adjacent layers of the laminate body, and manufacturing a mask for exposing streaks on a desired resist with the aid of a difference of X-rays absorption amounts between each layer by exposing X-ray in parallel to the direction of the laminate layer.
申请公布号 US5364717(A) 申请公布日期 1994.11.15
申请号 US19920953669 申请日期 1992.10.01
申请人 TOKYO INSTITUTE OF TECHNOLOGY 发明人 FURUYA, KAZUHITO;MIYAMOTO, YASUYUKI
分类号 G03F1/16;G03F1/14;H01L21/027;(IPC1-7):G03F9/00 主分类号 G03F1/16
代理机构 代理人
主权项
地址