发明名称 CLEANING APPARATUS
摘要 PURPOSE:To suppress contamination of an element to be cleaned such as a semiconductor wafer by increasing the degree of freedoms of selecting a material of a filter material and selecting a suitable filtering material. CONSTITUTION:A filter unit is provided at a sidewall of a transfer chamber at a lower side of a vertical heat treating furnace. This unit is formed in a cylindrical filter 5 by forming air supply holes 51 extended axially and closed at lower ends in a cylindrical filter material 51 formed in a cylindrical shape of a metal porous body, provided with an air flow control panel 6 so as to surround parts of peripheries at its back surface side, provided with air flow control plates 61, 62 made of punching metal plates, etc., at a front surface side to convert gas diffused from the filter 5 to a laminar flow. The air is fed to multiple air supply holes 52 under pressure, for example, through a manifold from a pump.
申请公布号 JPH06313596(A) 申请公布日期 1994.11.08
申请号 JP19930128293 申请日期 1993.04.30
申请人 TOKYO ELECTRON LTD;TOKYO ELECTRON TOHOKU LTD 发明人 TANAHASHI TAKASHI;MATSUO TAKENOBU
分类号 B01D46/24;B01D46/42;F24F7/06;H01L21/02;(IPC1-7):F24F7/06 主分类号 B01D46/24
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