| 摘要 |
PURPOSE:To replace a defective block with a non-defective block dispensing with a block selecting circuit and to improve an integrated circuit in yield by a method wherein a temporary wiring is removed after various blocks are tested, and an actual wiring is formed. CONSTITUTION:Semiconductor elements such as MOS transistors which form circuit blocks are manufactured in a first process 1 through conventional integrated circuit manufacturing treatments such as photolithography, impurity diffusion, ion implantation, and the like, and circuit blocks are connected together through a temporary wiring (one or more layers of conductor wiring) in a second process 2. The circuit blocks are subjected to a performance test in a third process 3, the temporary wiring is removed in a fourth process 4, and only normal circuit blocks are connected together through an actual wiring (one or more layers of conductor wiring) in a fifth process 5 avoiding defective blocks found in a block operation test. Therefore, an integrated circuit, can be improved in yield without increasing it in scale and operating delay time. |
