| 摘要 |
PURPOSE:To provide the testing circuit for exerting no influence on a speed of a regular operation of an adder. CONSTITUTION:The testing circuit is provided with selectors 21-28 for selecting one of each of input data A, B and each of test data X, Y, selectors 31-38 for selecting one of each of output data from the selectors 21-28 and test data Z and supplying it to input terminals (a), (b) of each of full adders 11-14, respectively, and a test control circuit for supplying the test data X, Y and Z, and also, supplying switching signals K1-K3 for controlling a selecting operation of the selectors 21-28, 31-38. |
