发明名称 Interferometric measuring system.
摘要 <p>Interferometric measuring systems are known. They contain a light source for generating coherent light, and an interferometer structure consisting of at least one beam splitter and two reflectors as well as lenses for focusing the light beam. According to the invention, such a measuring system serves for examining the frequency, modes, mode stability and mode distribution as well as coherence length and coherence time, etc. of a light bundle (30) transmitted from a laser light source (1). The light bundle (30) is rendered parallel by a lens, and subsequently passes to the reflectors (4, 5) in two component bundles (31, 32) via the beam splitter (3). One of the two component bundles traverses a reference interference pattern (7). The two component bundles (31, 32) interfere with one another and are fed via an optical system for reducing the numerical aperture to a photoreceiver (10). It is particularly advantageous if as many optical components as possible, in particular the lens (2), the beam splitter (3), the reflectors (4, 5) and the reference interference pattern (7), are monolithically integrated on one block (6). <IMAGE></p>
申请公布号 EP0415143(B1) 申请公布日期 1994.10.26
申请号 EP19900115295 申请日期 1990.08.09
申请人 ALCATEL SEL AKTIENGESELLSCHAFT;ALCATEL N.V. 发明人 DUETTING, KASPAR;WUENSTEL, KLAUS, DR. RER. NAT.;MAYER, HANS-PETER, DR. RER. NAT.;LOESCH, KURT, DR. RER. NAT.
分类号 G01B9/02;G01J9/00;G01J9/02;(IPC1-7):G01B9/02 主分类号 G01B9/02
代理机构 代理人
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