发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 forming a separating domain, a gate oxide film, a gate electrode matter, an isolating film and a nitrite film in oder, patterning those, and forming a gate electrode; injecting ions into a substrate; forming a oxide film and a nitrite film spacer on the side wall of the gate electrode; etching an ion injection domain of a silicon substrate selectively using the nitrite film spacer as a mask; growing an oxide film on the ion injection domain; and removing the nitrite film spacer to shape a source/drain domain.
申请公布号 KR940010545(B1) 申请公布日期 1994.10.24
申请号 KR19910020726 申请日期 1991.11.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, BYONG - RYOL
分类号 H01L21/335;(IPC1-7):H01L21/335 主分类号 H01L21/335
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