发明名称 |
FABRICATING METHOD OF MOS TRANSISTOR |
摘要 |
forming a gate isolating film (20), a poly silicon layer (30), and an oxide film (40); etching the oxide film (40) and the poly silicon layer (30) to leave a thin poly layer (32); using the gate poly (34) as a mask to forming a first source and drain domain (n-) by injecting impurities; forming a first spacer (50) on the side wall of the gate poly (34); using the first spacer (50) as a mask to form a second source and drain domain (no); etching the thin poly layer (32) to form a second spacer (60) on the side wall of the first spacer; using the second spacer (60) as a mask to form a third source and drain domain (n+).
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申请公布号 |
KR940010543(B1) |
申请公布日期 |
1994.10.24 |
申请号 |
KR19910017127 |
申请日期 |
1991.09.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JAE - HO |
分类号 |
H01L21/335;(IPC1-7):H01L21/335 |
主分类号 |
H01L21/335 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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