发明名称 MULTILAYER WIRING METHOD OF SEMICONDUCTOR DEVICE
摘要 The method prevents a glue layer from getting etched by keeping a tungsten layer over the glue layer as an electric conduction layer, prevents bubbles from generating within the contact window by repeating the deposition/etching processes in the case of depositing the tungsten vapor. The method comprises a step of forming a contact window at an interlayer insulation layer; a step of forming the glue layer over the whole substrate; a step of forming a first electric conduction layer; a step of slantly etching the first electric conduction layer; a step of repeating the first electric conduction deposition step more than once; a step of forming a second electric conduction layer on the resulted whole face; a step of patterning the materials layered over the interlayer insulation layer.
申请公布号 KR940010522(B1) 申请公布日期 1994.10.24
申请号 KR19910020705 申请日期 1991.11.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AN, YONG - CHOL;CHOE, SU - HAN
分类号 H01L21/3205;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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