发明名称 |
MULTILAYER WIRING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
The method prevents a glue layer from getting etched by keeping a tungsten layer over the glue layer as an electric conduction layer, prevents bubbles from generating within the contact window by repeating the deposition/etching processes in the case of depositing the tungsten vapor. The method comprises a step of forming a contact window at an interlayer insulation layer; a step of forming the glue layer over the whole substrate; a step of forming a first electric conduction layer; a step of slantly etching the first electric conduction layer; a step of repeating the first electric conduction deposition step more than once; a step of forming a second electric conduction layer on the resulted whole face; a step of patterning the materials layered over the interlayer insulation layer.
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申请公布号 |
KR940010522(B1) |
申请公布日期 |
1994.10.24 |
申请号 |
KR19910020705 |
申请日期 |
1991.11.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AN, YONG - CHOL;CHOE, SU - HAN |
分类号 |
H01L21/3205;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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