发明名称 |
FORMATION METHOD OF PHASE-SHIFT MASK |
摘要 |
PURPOSE: To provide the formation of a phase shift mask for forming a resist pattern with high resolution on a wafer. CONSTITUTION: A chromium pattern 12 is formed on one surface of a transparent glass plate 11 and a phase shift layer pattern 13' which is self-arrayed with this chromium pattern 12 is formed on the other surface of the transparent glass plate 11. Consequently, the superposition precision error between the phase shift layer pattern 13' and chromium pattern 12 is minimized. |
申请公布号 |
JPH06295053(A) |
申请公布日期 |
1994.10.21 |
申请号 |
JP19930209560 |
申请日期 |
1993.08.24 |
申请人 |
GENDAI DENSHI SANGYO KK |
发明人 |
KIN EISHIKI;KAN EIBOKU;KIYO YOKUHAN;KIN KOICHI |
分类号 |
G03F1/68;G03F1/00;G03F1/29;G03F1/38;G03F1/80;H01L21/027 |
主分类号 |
G03F1/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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