发明名称 METHOD AND APPARATUS FOR TESTING CIRCUIT BOARDS
摘要 A test system is associated with a chain of circuits on a circuit board for testing the interconnections linking the circuits in the chain as well as for testing the interconnections linking them to those on other boards. The test system includes a controller for generating a test signal and for capturing a response signal generated by the associated chain of circuits in response to the test signal. The controller also generates a flow control signal which controls a network that routes the test signals from the controller, or from a first other test system, to the associated chain of circuits. In accordance with the flow control signal, the network also serves to route the response signal from the associated chain of circuits to the controller or to a second other test system. By selectively routing the test and response signals, the network in each test system allows individual testing of each associated chain of circuits or, alternatively, permits the chains of circuits on several boards to be effectively interconnected for testing.
申请公布号 CA2013248(C) 申请公布日期 1994.10.18
申请号 CA19902013248 申请日期 1990.03.28
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 JARWALA, NAJMI T.;YAU, CHI W.
分类号 G01R31/3183;G01R31/28;G01R31/3181;G01R31/3185;G06F11/22;H01L21/66;(IPC1-7):G01R31/28 主分类号 G01R31/3183
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