| 摘要 |
PURPOSE:To simplify the test of each module, and to improve a failure detecting rate using a short test data and moreover to sharply shorten a simulation time, and thus to sharply reduce the manufacturing cost for IC by making input selection in the second and the third modules through a test mode controller, and selectively outputting the output data of the first module and of the second module through an output selector. CONSTITUTION:The integrated circuit device has the first the second and the third modules 8, 9, 10 for severally making a prescribed process to input data, and a test mode controller 6 and an output controller 7 which control the input and output state to the signals of the modules 8, 9, 10 in the case of testing the motions of the above modules. |
