发明名称 Semiconductor memory device having improved write characteristic
摘要 The present invention comprises a groove formed in a semiconductor substrate, a buried element isolation region formed in the groove, source and drain diffusion regions formed inside the buried element isolation region, an electrode wiring layer connected the buried element isolation region across the diffusion regions and constituted by a two-layered structure consisting of a control gate and a floating gate, and a side-wall diffusion region which extends along the groove, is in contact with the source and drain diffusion regions, and is formed at a position corresponding to at least the electrode wiring layer. As a result, the write characteristic of a non-volatile memory can be improved, and at the same time, the non-volatile memory can be micropatterned.
申请公布号 US5357133(A) 申请公布日期 1994.10.18
申请号 US19920982844 申请日期 1992.11.30
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MORITA, SHIGERU
分类号 H01L21/8247;H01L21/336;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/78;H01L27/02 主分类号 H01L21/8247
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