| 摘要 |
<p>PURPOSE:To provide the method for easily and exactly correcting the spot defect in the additive capacitance part of the pixels of the active matrix display device. CONSTITUTION:The additive capacitance part of the pixel electrode and the non- additive capacitance part are disconnected by irradiating these parts with a laser from outside a substrate in the state of constituting the device when the spot defect is detected in the additive capacitance part of the pixel electrode. (a) A gate electrode and a source electrode are then fusion connected by the laser and (b) in succession, the gate electrode and a drain electrode are fusion connected by the laser. (c) In succession, the branch part from the scanning line of the gate electrode is fusion cut by the laser. (d) The combined resistance between the terminal of the scanning line and the terminal of the signal line is approximately equal to the cutting resistance and, therefore, the cutting resistance R is measured if the resistance between both terminals is measured. (e) The scanning line and the signal line are shorted via the pixel electrode if the shorting of the signal line and the pixel electrode is executed while the cutting is incomplete. This shorting is recognized as a line defect on the display and is the grave display defect. The cutting resistance R is measured in order to prevent such defect.</p> |
