发明名称 STRUCTURE & MANUFACTURING METHOD OF SEMICONDUCTOR MEMORY DEVICE
摘要 The semiconductor memory device is structured that a trench is formed in a semiconductor substrate, a first plate node is formed on the bottom of the trench, a dielectric layer and a storage node are formed in the trench, a source/drain is formed on a side of the storage node to be connected to the storage node, a second dielectric layer and plate node are formed on the storage node, and a word line is formed between the source and drain.
申请公布号 KR940009624(B1) 申请公布日期 1994.10.15
申请号 KR19910020128 申请日期 1991.11.13
申请人 GOLDSTAR ELECTRON CO., LTD. 发明人 KWAK, JONG - SOK
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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