发明名称 MANUFACTURING METHOD OF HIGHLY INTEGRATED SEMICONDUCTOR MEMORY DEVICE
摘要 forming a first insulating layer for insulating a transistor formed on a substrate; selectively etching the first insulating layer to form a contact hole; forming a first storage electrode pattern to be connected to the source of the transistor through the contact hole; and forming a second storage electrode on the side wall of the first storage electrode pattern; thereby increasing the effective area of the storage electrode.
申请公布号 KR940009630(B1) 申请公布日期 1994.10.15
申请号 KR19910020709 申请日期 1991.11.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOE, YONG - JE
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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