发明名称 |
MANUFACTURING METHOD OF HIGHLY INTEGRATED SEMICONDUCTOR MEMORY DEVICE |
摘要 |
forming a first insulating layer for insulating a transistor formed on a substrate; selectively etching the first insulating layer to form a contact hole; forming a first storage electrode pattern to be connected to the source of the transistor through the contact hole; and forming a second storage electrode on the side wall of the first storage electrode pattern; thereby increasing the effective area of the storage electrode.
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申请公布号 |
KR940009630(B1) |
申请公布日期 |
1994.10.15 |
申请号 |
KR19910020709 |
申请日期 |
1991.11.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOE, YONG - JE |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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