发明名称 |
FORMING METHOD OF METAL WIRING FILM |
摘要 |
The method includes the steps of forming an insulating layer on a semiconductor substrate on which a lower metal layer is formed, forming a contact hole to expose a portion of the lower metal layer, ion-implanting impurities into the substrate, sequentially forming a barrier layer and polysilicon layer on the overall surface of the substrate, etching back the polysilicon layer and barrier layer to form a plug in the contact hole, and forming a upper metal layer on the substrate, thereby decreasing the contact resistance of the metal layers.
|
申请公布号 |
KR940009595(B1) |
申请公布日期 |
1994.10.15 |
申请号 |
KR19910016717 |
申请日期 |
1991.09.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JIN, YU - CHAN;HYONG, YONG - U;JANG, TAE - KYU;JANG, HYON - KUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|