发明名称 FORMING METHOD OF METAL WIRING FILM
摘要 The method includes the steps of forming an insulating layer on a semiconductor substrate on which a lower metal layer is formed, forming a contact hole to expose a portion of the lower metal layer, ion-implanting impurities into the substrate, sequentially forming a barrier layer and polysilicon layer on the overall surface of the substrate, etching back the polysilicon layer and barrier layer to form a plug in the contact hole, and forming a upper metal layer on the substrate, thereby decreasing the contact resistance of the metal layers.
申请公布号 KR940009595(B1) 申请公布日期 1994.10.15
申请号 KR19910016717 申请日期 1991.09.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JIN, YU - CHAN;HYONG, YONG - U;JANG, TAE - KYU;JANG, HYON - KUN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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