发明名称 FORMING METHOD OF METAL CONTACT
摘要 shaping circuit devices on the semiconductor substrate using a conventional method; shaping an insulator layer on the top of the substrate; shaping a contact hole through the insulator layer, depositing and flowing the pure silicon into an aluminum layer; etching the aluminum by the photoresist which is shaped on the aluminum; silicon ion implantationing into the rest of aluminum layer and to the top of the insulator layer. And the method comprises an ion implantation after flowing process, etching the rest of the aluminum layer by the photoresist after forming the metal pattern, and annealing the aluminum.
申请公布号 KR940009591(B1) 申请公布日期 1994.10.15
申请号 KR19910009329 申请日期 1991.06.05
申请人 GOLDSTAR ELECTRON CO., LTD. 发明人 SO, KWANG - HA
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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