发明名称 METHOD OF MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 forming an etch stop layer on a semiconductor substrate; coating a first material on the etch stop layer, selectively etching the first material layer using a first mask pattern for forming a storage electrode to form a first pattern; coating a second material to fill the groove placed between the first patterns, selectively etching the second material layer to form a second pattern; removing the first and second pattern, forming a first conductive layer on the overall surface of the substrate; removing the first conductive layer placed on the remaining second material layer to define the first conductive layer into unit cells.
申请公布号 KR940009619(B1) 申请公布日期 1994.10.15
申请号 KR19910016618 申请日期 1991.09.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN, JUNG - HYON
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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