发明名称 |
METHOD OF MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
forming an etch stop layer on a semiconductor substrate; coating a first material on the etch stop layer, selectively etching the first material layer using a first mask pattern for forming a storage electrode to form a first pattern; coating a second material to fill the groove placed between the first patterns, selectively etching the second material layer to form a second pattern; removing the first and second pattern, forming a first conductive layer on the overall surface of the substrate; removing the first conductive layer placed on the remaining second material layer to define the first conductive layer into unit cells.
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申请公布号 |
KR940009619(B1) |
申请公布日期 |
1994.10.15 |
申请号 |
KR19910016618 |
申请日期 |
1991.09.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SHIN, JUNG - HYON |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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