Method for testing a semiconductor integrated circuit having self testing circuit

摘要

A method is provided for testing a semiconductor integrated circuit including a main circuit, a self testing circuit for testing at least one part of the functions of the main circuit, and a test result output circuit having at least one light emitting device for outputting results from the self testing circuit in the form of light. The method includes the steps of inputting a test start to the self testing circuit so as to initiate operation of the self testing circuit; detecting light emitted from the light emitting device with an optical system, the light being emitted based on the test results from the self testing circuit; and obtaining the test results based on the light detection.