发明名称 Dry etching method
摘要 Etching of an article is carried out by maintaining the article at a temperature at which the vapor pressure of etching gas molecules becomes equal to or higher than the pressure of etching gas and the vapor pressure of neutral radicals contained in a plasma becomes equal to or lower than the pressure of an etching gas. An etching pattern with a substantially vertical side profile and extremely small in dimensional shift from the mask can be formed at high precision.
申请公布号 US5354416(A) 申请公布日期 1994.10.11
申请号 US19900503124 申请日期 1990.04.02
申请人 OKUDAIRA, SADAYUKI;TSUJIMOTO, KAZUNORI;TACHI, SHINICHI 发明人 OKUDAIRA, SADAYUKI;TSUJIMOTO, KAZUNORI;TACHI, SHINICHI
分类号 H01L21/3065;H01L21/3213;(IPC1-7):H05H1/00 主分类号 H01L21/3065
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