发明名称 AUTOMATIC EXTERNAL APPEARANCE INSPECTING DEVICE AND INSPECTING METHOD USING SAME
摘要 PURPOSE:To improve defect detecting precision by arranging plural focus offsets optionally. CONSTITUTION:Firstly, a focus is automatically adjusted in a reference focus position 14 by an automatic focusing offset unit. Secondly, focus offset values A, B are set and a focus position is switched sequently from 15 to 16, so that a focus can be adjusted properly to respective layers such as a wiring part 18 and a contact part, 19, and consequently, a failure to find a defect is eliminated and defect detecting precision is improved.
申请公布号 JPH06281409(A) 申请公布日期 1994.10.07
申请号 JP19930066580 申请日期 1993.03.25
申请人 NEC KANSAI LTD 发明人 IWAMOTO YOSHIHIRO
分类号 G01B9/04;G01B11/00;G02B7/28;H01L21/66;(IPC1-7):G01B11/00 主分类号 G01B9/04
代理机构 代理人
主权项
地址