发明名称 METHOD FOR INCREASED SENSITIVITY OF RADIATION DETECTION AND MEASUREMENT
摘要 Dose of radiation to which a body of crystalline material has been exposed is measured by exposing the body to optical radiation at a first wavelength, which is greater than about 540 nm, and measuring optical energy emitted from the body by luminescence at a second wavelength, which is longer than the first wavelength. Reduced background is accomplished by more thorough annealing and enhanced radiation induced luminescence is obtained by treating the crystalline material to coalesce primary damage centers into secondary damage centers.
申请公布号 CA2154780(A1) 申请公布日期 1994.09.29
申请号 CA19942154780 申请日期 1994.03.07
申请人 BATTELLE MEMORIAL INSTITUTE 发明人 MILLER, STEVEN D.
分类号 G01T1/10;G01T1/105;(IPC1-7):G01T1/105 主分类号 G01T1/10
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