发明名称 Device with a charged beam
摘要 A device with a charged beam has the following features: a vacuum chamber with a motion mechanism on the inside and a sample chamber (compartment). The sample chamber used is placed in an ultrahigh vacuum atmosphere or a gas atmosphere, a flat surface being formed on that surface of the motion mechanism which points towards the sample chamber and a flange having a flat open surface being arranged between the vacuum chamber and the sample chamber such that the open surface is opposite the flat surface, and is specifically formed with a small slot between the open surface and the flat surface to permit vacuum ventilation without any restrictions being placed on the motion mechanism, as a result of which the device operates without restricting the effect of the motion mechanism.
申请公布号 DE4408523(A1) 申请公布日期 1994.09.29
申请号 DE19944408523 申请日期 1994.03.14
申请人 AGENCY OF INDUSTRIAL SCIENCE AND TECHNOLOGY, TOKIO/TOKYO, JP 发明人 OKAYAMA, SHIGEO, TSUKUBA, IBARAKI, JP;OGURA, MUTSUO, TSUKUBA, IBARAKI, JP;KOMURO, MASANORI, RYUGASAKI, IBARAKI, JP;HIROSHIMA, HIROSHI, TSUKUBA, IBARAKI, JP
分类号 H01J37/18;H01J37/20;H01J37/28;H01J37/305;H01L21/027;(IPC1-7):H01J37/20;G01N27/62;H01J37/30 主分类号 H01J37/18
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