发明名称 METHOD OF MANUFACTURING CAPACITOR
摘要 The method improves the reliability of capacitors by forming a native oxide layer and a Ta2O5 layer. The method comprises (A) growing a native oxide (4) on an n-type Si substrate; (B) depositing a Ta2O5 layer (5) on the native oxide; (C) oxidizing the weakspot under oxidizing atmosphere; (D) forming a metal electrode (3) by sputtering or vapor depositing.
申请公布号 KR940008893(B1) 申请公布日期 1994.09.28
申请号 KR19870015499 申请日期 1987.12.31
申请人 GOLDSTAR ELECTRON CO., LTD. 发明人 YUN, KI - WAN
分类号 H01G4/00;(IPC1-7):H01G4/00 主分类号 H01G4/00
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