发明名称 Vapor drain system.
摘要 During wafer fabrication, a transportable enclosure, such as a Standard Manufacturing InterFace (SMIF) pod encloses a nascent product, such as a semiconductor wafer, to protect the wafer against contamination during manufacture, storage or transportation. However chemical vapors emitted inside the pod can accumulate in the air and degrade wafers during subsequent fabrication. In order to absorb the vapors inside a closed pod, a vapor removal element typically including an activated carbon absorber, covered by a particulate-filtering vapor-permeable barrier, and covered by a guard plate with holes is disposed within the enclosure. A vapor removal element is disposed closely adjacent to each respective wafer. Alternatively, a single vapor removal element is located inside the enclosure. In certain instances, a fan or thermo-buoyant circulation causes any vapors located inside the enclosure to a vapor removal element for removal. Alternatively a porous vapor removal element may be disposed for removing vapors from air entering the enclosure. In another embodiment a vapor removal element is integrated with the back face of each wafer. <IMAGE>
申请公布号 EP0617573(A1) 申请公布日期 1994.09.28
申请号 EP19940102707 申请日期 1994.02.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BASEMAN, ROBERT JEFFREY;BROWN, CHARLES ALLAN;ELDRIDGE, BENJAMIN NILES;ROTHMAN, LAURA BETH;WENDT, HERMAN RUSSEL;YEH, JAMES TIEN-CHENG;ZINGHER, ARTHUR R.
分类号 B65G1/00;B65D85/86;H01L21/673;H01L21/677;(IPC1-7):H05K13/00 主分类号 B65G1/00
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