发明名称 |
Semiconductor device comprising a bipolar transistor and method of production of the same |
摘要 |
A semiconductor device is disclosed, in which a stable resistive contact having low resistance can be achieved in a base contact region, without reducing the emitter-base breakdown voltage and the current gain. In this semiconductor device, a p<++>-type base contact layer 8, having an impurity concentration which is larger than that of a p<+>-type base layer 5, is formed in a region, separated by a predetermined distance from an n<+>-type emitted layer 7, on the main surface of the p<+>-type base layer 5. The p<++>-type base contact layer 8 having a high concentration consequently does not come in contact with the n<+>-type emitter layer 7, and the current gain and the emitter-base breakdown voltage are furthermore not decreased. Since the p<++>-type base contact layer 8 is formed in such a way that it has a diffusion depth which is shallower than that of the n<+>-type emitter layer 7, the lateral extent of the p<++>-type base contact layer 8 can be decreased. The side face of the p<++>-type base contact layer 8 having a high concentration can therefore effectively be prevented from coming into contact with the side face of the n<+>-type emitter layer 7 even when the elements are made smaller. <IMAGE>
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申请公布号 |
DE4400840(A1) |
申请公布日期 |
1994.09.22 |
申请号 |
DE19944400840 |
申请日期 |
1994.01.13 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP |
发明人 |
IKEGAMI, MASAAKI, ITAMI, HYOGO, JP |
分类号 |
H01L21/28;H01L21/331;H01L29/10;H01L29/73;H01L29/732;(IPC1-7):H01L29/73 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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