发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURE |
摘要 |
PURPOSE:To acquire a semiconductor memory device and its manufacturing method, wherein shift of a pattern during storage node formation does not matter and a mask alignment margin is enlarged in a memory cell of a semiconductor memory device. CONSTITUTION:An electrode plug 14 is provided inside a storage node direct contact 9, a storage node direct contact side wall 12 of an insulation film is formed to reduce a diameter of a contact from an port of a contact to a surface of the electrode plug 14 and the electrode plug 14 inside a contact and a storage node 10 make a continuity through a reduced hole diameter. |
申请公布号 |
JPH06268175(A) |
申请公布日期 |
1994.09.22 |
申请号 |
JP19930052458 |
申请日期 |
1993.03.12 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
SOEDA SHINYA;ISHIKAWA HIDEKAZU |
分类号 |
H01L27/10;H01L21/8242;H01L21/8246;H01L27/105;H01L27/108 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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