发明名称 SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURE
摘要 PURPOSE:To acquire a semiconductor memory device and its manufacturing method, wherein shift of a pattern during storage node formation does not matter and a mask alignment margin is enlarged in a memory cell of a semiconductor memory device. CONSTITUTION:An electrode plug 14 is provided inside a storage node direct contact 9, a storage node direct contact side wall 12 of an insulation film is formed to reduce a diameter of a contact from an port of a contact to a surface of the electrode plug 14 and the electrode plug 14 inside a contact and a storage node 10 make a continuity through a reduced hole diameter.
申请公布号 JPH06268175(A) 申请公布日期 1994.09.22
申请号 JP19930052458 申请日期 1993.03.12
申请人 MITSUBISHI ELECTRIC CORP 发明人 SOEDA SHINYA;ISHIKAWA HIDEKAZU
分类号 H01L27/10;H01L21/8242;H01L21/8246;H01L27/105;H01L27/108 主分类号 H01L27/10
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