发明名称 DEFECT DETECTING DEVICE
摘要 PURPOSE:To reduce the probability of error detection, which is due to stray light, of a foreign matter and to detect a foreign matter having a small gap in high probability. CONSTITUTION:A light beam from a light source 7 is converted into a sheet light beam L2 via lens systems 8, 9 and the light beam L2 slantly irradiates an area 10 on a pellicle 1, while a light beam from a light source 11 is converted into a sheet light beam L4 via lens systems 12. 13 and the light beam L4 vertically irradiates the area 10 on the pellicle 1. Scattered light from a defect such as a foreign matter in the area 10 is condensed by a light receiving lens 14, and an image of the defect is formed on an image pickup face of a one dimensional image pickup element 15 by the condensed light. A foreign matter having a small gap is detected by scattered light of the light beam L4.
申请公布号 JPH06258233(A) 申请公布日期 1994.09.16
申请号 JP19930042424 申请日期 1993.03.03
申请人 NIKON CORP 发明人 HAYANO FUMITOMO
分类号 G01N21/27;G01N21/88;G01N21/94;G01N21/956;G03F1/84;H01L21/027;H01L21/30;H01L21/66 主分类号 G01N21/27
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